The Probabilistic-Inputs, Noisy “And” Gate Model

Journal of Psychological Science ›› 2015, Vol. 38 ›› Issue (5) : 1230-1238.

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PDF(381 KB)
Journal of Psychological Science ›› 2015, Vol. 38 ›› Issue (5) : 1230-1238.

The Probabilistic-Inputs, Noisy “And” Gate Model

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Abstract

Cognitive diagnosis (CD), which is also referred as skill assessment or skill profiling, utilizes latent class models to provide fine-grained information about students’ strength and weakness in the learning process. One major advantage of CD is the capacity to provide additional information about the instructional needs of students. In the past decades, extensive research has been conducted in the area of CD and many statistical models based on a probabilistic approach have been proposed. Examples of cognitive diagnostic models (CDM) include the deterministic inputs, noisy and gate (DINA) model(Junker & Sijtsma, 2001), the deterministic input, noisy or gate (DINO) model (Templin & Henson, 2006), and C-RUM (Hartz, 2002). Currently, the outcome of CDM is a profile with binary element for each examine to indicate the mastery/non-mastery status of every attribute/skill, i.e. the attribute mastery status (AMS). But this coarse classification or diagnosis results unable to distinguish the individual differences between different students subtly, especially those students who are assigned into a same category. So the AMS may not conducive to be used by teachers to make decisions regarding the optimal intervention that should be put into place for the students. In order to obtain a nuanced profile of the student with respect to students’ characteristics, this study proposed the Probabilistic-Inputs, Noisy “And” gate (PINA) model based on the attribute mastery probability (AMP), which means that the AMP was used in CDM instead of the AMS. Firstly, model the AMP as arising from higher-order latent trait resembling the θ of item response models (de la Torre & Douglas, 2004). Then, the multicomponent latent traits model (Embretson, 1980, 1984) has been taken as a template from the PINA model. The results of a series of simulations based on Markov chain Monte Carlo methods showed that the model parameters and AMP-profiles can be recovered relatively accurately. An analysis of the fraction subtraction data is provided as an example. Key words□□cognitive diagnosis, attribute mastery probability, PINA model, higher-order latent traits, multicomponent latent traits

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cognitive diagnosis / attribute mastery probability / PINA model / higher-order latent traits / multicomponent latent traits / item response theory / DINA

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The Probabilistic-Inputs, Noisy “And” Gate Model[J]. Journal of Psychological Science. 2015, 38(5): 1230-1238
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